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Wednesday, 15 April 2015 00:00

Paper presentation @ DTIS 2015

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Partner POLITO presents a paper at DTIS 2015 on STT-MRAM Cell Reliability Evaluation under Process, Voltage and Temperature (PVT) Variations

This paper presents a reliability prediction model for MRAM taking into account process, voltage and temperature variations.

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2015-06-15-DTISpresentation_001

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