Advanced multifunctional computing systems realized in forthcoming technologies hold the promise of a significant increase of the computational capability that will offer end-users ever improving services and functionalities (e.g., next generation mobile devices, cloud services, etc.). However, the same path that is leading technologies toward these remarkable achievements is also making electronic devices increasingly unreliable posing a threat to our society that is depending on the computers and electronic devices in every aspect of human activities. As an example, the 2012 ITRS roadmap lists aging in semiconductor devices as one of the few most difficult challenges concerning reliability.
This workshop provides a unique chance to join experts from three on-going European projects that address several reliability challenges.The topics that will be covered include fault modeling in forthcoming technologies, careful early reliability evaluation of complex designs as well as techniques to address No Failure Found (NFF), which is caused by a combination of test escapes, aging, and environmental impact.
Additional infor at the workshop website.
https://www.clereco.eu/news/item/122-1st-international-workshop-on-reliability-and-aging-in-forthcoming-electronic-systems-ets2015#sigProGalleria019e34ee70
