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Tuesday, 11 April 2017 09:10

Paper presentation @ VTS 2017 in Las Vegas, USA

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Partner UoA presents the paper Performance-Aware Reliability Assessment of Heterogeneous Chips at 35th IEEE VLSI Test Symposium 2017 (VTS17)

The presentation is scheduled on Tuesday (April, 11th), during session 5B – Reliability Analysis and Yield Optimization, Room Pompeian II, at 08:30. If you’re attending the conference don’t miss the presentation.
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