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Monday, 27 July 2015 00:00

Bayesian Network Early Reliability Evaluation Analysis for both Permanent and Transient Faults

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A.Vallero, A.Savino, G.Politano, S.Di Carlo, S.Tselonis, M.Kaliorakis, N.Foutris, D.Gizopoulos, IEEE International On-Line Testing Symposium (IOLTS 2015), July 2015.

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Abstract

Analyzing the impact of software execution on the reliability of a complex digital system is an increasing challenging task. Current approaches mainly rely on time consuming fault injections experiments that prevent their usage in the early stage of the design process, when fast estimations are required in order to take design decisions. To cope with these limitations, this paper proposes a statistical reliability analysis model based on Bayesian Networks. The proposed approach is able to estimate system reliability considering both the hardware and the software layer of a system, in presence of hardware transient and permanent faults. In fact, when digital system reliability is under analysis, hardware resources of the processor and instructions of program traces are employed to build a Bayesian Network. Finally, the probability of input errors to alter both the correct behavior of the system and the output of the program is computed. According to experimental results presented in this paper, it can be stated that Bayesian Network model is able to provide accurate reliability estimations in a very short period of time. As a consequence it can be a valid alternative to fault injection, especially in the early stage of the design.

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  •  BIBTEX:
@INPROCEEDINGS{7229819, 
  author={A. Vallero and A. Savino and S. Tselonis and N. Foutris and M. Kaliorakis and G. Politano and D. Gizopoulos and S. Di Carlo}, 
  booktitle={On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International}, 
  title={Bayesian network early reliability evaluation analysis for both permanent and transient faults}, 
  year={2015}, 
  pages={7-12}, 
  keywords={belief networks;software fault tolerance;statistical analysis;Bayesian network;digital system reliability;early reliability evaluation analysis;fault injections experiments;permanent fault;reliability estimation;software execution;statistical reliability analysis model;transient fault;Analytical models;Bayes methods;Estimation;Hardware;Registers;Reliability;Software}, 
  doi={10.1109/IOLTS.2015.7229819}, 
  month={July},
}
  • DOI: 10.1109/IOLTS.2015.7229819
  • KEYWORDS: belief networks;software fault tolerance;statistical analysis;Bayesian network;digital system reliability;early reliability evaluation analysis;fault injections experiments;permanent fault;reliability estimation;software execution;statistical reliability analysis model;transient fault;Analytical models;Bayes methods;Estimation;Hardware;Registers;Reliability;Software

 

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