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Tuesday, 02 June 2015 00:00

A Bayesian model for system level reliability estimation

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Vallero, A.; Savino, A.; Tselonis, S.; Foutris, N.; Kaliorakis, M.; Politano, G.; Gizopoulos, D.; Di Carlo, S., 20th IEEE European Test Symposium (ETS), Cluj-Napoca, RO, 25-29 May 2015. pp. 1-2

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Abstract

Nowadays, the scientific community is looking for ways to understand the effect of software execution on the reliability of a complex system when the hardware layer is unreliable. This paper proposes a statistical reliability analysis model able to estimate system reliability considering both the hardware and the software layer of a system. Bayesian Networks are employed to model hardware resources of the processor and instructions of program traces. They are exploited to investigate the probability of input errors to alter both the correct behavior and the output of the program. Experimental results show that Bayesian networks prove to be a promising model, allowing to get accurate and fast reliability estimations w.r.t. fault injection/simulation approaches.

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  •  BIBTEX:
@INPROCEEDINGS{7138745, 
  author={A. Vallero and A. Savino and S. Tselonis and N. Foutris and M. Kaliorakis and G. Politano and D. Gizopoulos and S. Di Carlo}, 
  booktitle={Test Symposium (ETS), 2015 20th IEEE European}, 
  title={A Bayesian model for system level reliability estimation}, 
  year={2015}, 
  pages={1-2}, 
  keywords={belief networks;estimation theory;large-scale systems;microcomputers;probability;reliability;statistical analysis;Bayesian model;Bayesian networks;complex system;hardware layer;hardware resources;program traces;scientific community;software execution;software layer;statistical reliability analysis model;system level reliability estimation;w.r.t. fault injection-simulation;Bayes methods;Computational modeling;Computer network reliability;Estimation;Hardware;Reliability;Software}, 
  doi={10.1109/ETS.2015.7138745}, 
  month={May},
}
  • DOI: 10.1109/ETS.2015.7138745
  • KEYWORDS: belief networks;estimation theory;large-scale systems;microcomputers;probability;reliability;statistical analysis;Bayesian model;Bayesian networks;complex system;hardware layer;hardware resources;program traces;scientific community;software execution;software layer;statistical reliability analysis model;system level reliability estimation;w.r.t. fault injection-simulation;Bayes methods;Computational modeling;Computer network reliability;Estimation;Hardware;Reliability;Software
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