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	<title type="text">Publications</title>
	<subtitle type="text">Cross-Layer Early Reliability Evaluation for the Computing cOntinuum</subtitle>
	<link rel="alternate" type="text/html" href="http://www.clereco.eu"/>
	<id>http://www.clereco.eu/publications</id>
	<updated>2019-04-30T07:21:02+00:00</updated>
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	<entry>
		<title>Microarchitecture level reliability comparison of modern GPU designs: First findings</title>
		<link rel="alternate" type="text/html" href="http://www.clereco.eu/publications/item/175-microarchitecture-level-reliability-comparison-of-modern-gpu-designs-first-findings"/>
		<published>2017-07-18T06:45:47+00:00</published>
		<updated>2017-07-18T06:45:47+00:00</updated>
		<id>http://www.clereco.eu/publications/item/175-microarchitecture-level-reliability-comparison-of-modern-gpu-designs-first-findings</id>
		<author>
			<name>Super User</name>
			<email>stefano.dicarlo@polito.it</email>
		</author>
		<summary type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;A. Vallero, S. Di Carlo, S. Tselonis and D. Gizopoulos,  2017 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS), Santa Rosa, CA, USA, 2017, pp. 129-130.
doi: 10.1109/ISPASS.2017.7975280&lt;/p&gt;
&lt;!--&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;--&gt;&lt;a href=&quot;https://doi.org/10.1109/ISPASS.2017.7975280&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</summary>
		<content type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;A. Vallero, S. Di Carlo, S. Tselonis and D. Gizopoulos,  2017 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS), Santa Rosa, CA, USA, 2017, pp. 129-130.
doi: 10.1109/ISPASS.2017.7975280&lt;/p&gt;
&lt;!--&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;--&gt;&lt;a href=&quot;https://doi.org/10.1109/ISPASS.2017.7975280&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</content>
		<category term="Publications" />
	</entry>
	<entry>
		<title>MeRLiN: Exploiting Dynamic Instruction Behavior for Fast and Accurate Microarchitecture Level Reliability Assessment</title>
		<link rel="alternate" type="text/html" href="http://www.clereco.eu/publications/item/174-copy-of-performance-aware-reliability-assessment-of-heterogeneous-chips"/>
		<published>2017-07-18T06:40:57+00:00</published>
		<updated>2017-07-18T06:40:57+00:00</updated>
		<id>http://www.clereco.eu/publications/item/174-copy-of-performance-aware-reliability-assessment-of-heterogeneous-chips</id>
		<author>
			<name>Super User</name>
			<email>stefano.dicarlo@polito.it</email>
		</author>
		<summary type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;Manolis Kaliorakis, Dimitris Gizopoulos, Ramon Canal, and Antonio Gonzalez. 2017. In Proceedings of the 44th Annual International Symposium on Computer Architecture (ISCA '17). ACM, New York, NY, USA, 241-254. DOI: https://doi.org/10.1145/3079856.3080225&lt;/p&gt;
&lt;!--&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;--&gt;&lt;a href=&quot;https://doi.org/10.1145/3079856.3080225&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</summary>
		<content type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;Manolis Kaliorakis, Dimitris Gizopoulos, Ramon Canal, and Antonio Gonzalez. 2017. In Proceedings of the 44th Annual International Symposium on Computer Architecture (ISCA '17). ACM, New York, NY, USA, 241-254. DOI: https://doi.org/10.1145/3079856.3080225&lt;/p&gt;
&lt;!--&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;--&gt;&lt;a href=&quot;https://doi.org/10.1145/3079856.3080225&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</content>
		<category term="Publications" />
	</entry>
	<entry>
		<title>Performance-aware reliability assessment of heterogeneous chips</title>
		<link rel="alternate" type="text/html" href="http://www.clereco.eu/publications/item/173-performance-aware-reliability-assessment-of-heterogeneous-chips"/>
		<published>2017-07-18T06:35:00+00:00</published>
		<updated>2017-07-18T06:35:00+00:00</updated>
		<id>http://www.clereco.eu/publications/item/173-performance-aware-reliability-assessment-of-heterogeneous-chips</id>
		<author>
			<name>Super User</name>
			<email>stefano.dicarlo@polito.it</email>
		</author>
		<summary type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;A. Chatzidimitriou, M. Kaliorakis, S. Tselonis and D. Gizopoulos,  2017 IEEE 35th VLSI Test Symposium (VTS), Las Vegas, NV, 2017, pp. 1-6.
doi: 10.1109/VTS.2017.7928940&lt;/p&gt;
&lt;!--&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;--&gt;&lt;a href=&quot;http://dx.doi.org/10.1109/VTS.2017.7928940&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</summary>
		<content type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;A. Chatzidimitriou, M. Kaliorakis, S. Tselonis and D. Gizopoulos,  2017 IEEE 35th VLSI Test Symposium (VTS), Las Vegas, NV, 2017, pp. 1-6.
doi: 10.1109/VTS.2017.7928940&lt;/p&gt;
&lt;!--&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;--&gt;&lt;a href=&quot;http://dx.doi.org/10.1109/VTS.2017.7928940&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</content>
		<category term="Publications" />
	</entry>
	<entry>
		<title>Cross-layer system reliability assessment framework for hardware faults</title>
		<link rel="alternate" type="text/html" href="http://www.clereco.eu/publications/item/172-cross-layer-system-reliability-assessment-framework-for-hardware-faults"/>
		<published>2017-05-03T13:55:24+00:00</published>
		<updated>2017-05-03T13:55:24+00:00</updated>
		<id>http://www.clereco.eu/publications/item/172-cross-layer-system-reliability-assessment-framework-for-hardware-faults</id>
		<author>
			<name>Super User</name>
			<email>stefano.dicarlo@polito.it</email>
		</author>
		<summary type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;A. Vallero, A. Savino, G. Politano, S. Di Carlo, A. Chatzidimitriou, S. Tselonis, M. Kaliorakis, D. Gizopoulos, M. Riera, R. Canal, A. Gonzalez, M. Kooli, A. Bosio, G. Di Natale, 2016 IEEE International Test Conference (ITC), Fort Worth, TX, 2016, pp. 1-10., doi: 10.1109/TEST.2016.7805863&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/TEST.2016.7805863&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</summary>
		<content type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;A. Vallero, A. Savino, G. Politano, S. Di Carlo, A. Chatzidimitriou, S. Tselonis, M. Kaliorakis, D. Gizopoulos, M. Riera, R. Canal, A. Gonzalez, M. Kooli, A. Bosio, G. Di Natale, 2016 IEEE International Test Conference (ITC), Fort Worth, TX, 2016, pp. 1-10., doi: 10.1109/TEST.2016.7805863&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/TEST.2016.7805863&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</content>
		<category term="Publications" />
	</entry>
	<entry>
		<title>RIIF-2: Toward the next generation reliability information interchange format</title>
		<link rel="alternate" type="text/html" href="http://www.clereco.eu/publications/item/171-riif-2-toward-the-next-generation-reliability-information-interchange-format"/>
		<published>2017-05-03T13:47:51+00:00</published>
		<updated>2017-05-03T13:47:51+00:00</updated>
		<id>http://www.clereco.eu/publications/item/171-riif-2-toward-the-next-generation-reliability-information-interchange-format</id>
		<author>
			<name>Super User</name>
			<email>stefano.dicarlo@polito.it</email>
		</author>
		<summary type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;A. Savino, S. Di Carlo, A. Vallero, G. Politano, D. Gizopoulos,  A. Evans, IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS 2016), 4-6 July 2016&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/IOLTS.2016.7604693.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/IOLTS.2016.7604693&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</summary>
		<content type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;A. Savino, S. Di Carlo, A. Vallero, G. Politano, D. Gizopoulos,  A. Evans, IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS 2016), 4-6 July 2016&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/IOLTS.2016.7604693.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/IOLTS.2016.7604693&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</content>
		<category term="Publications" />
	</entry>
	<entry>
		<title>A Detailed Methodology to Compute Soft-Error Rates in Advanced Technologies</title>
		<link rel="alternate" type="text/html" href="http://www.clereco.eu/publications/item/150-a-detailed-methodology-to-compute-soft-error-rates-in-advanced-technologies"/>
		<published>2016-03-24T19:24:13+00:00</published>
		<updated>2016-03-24T19:24:13+00:00</updated>
		<id>http://www.clereco.eu/publications/item/150-a-detailed-methodology-to-compute-soft-error-rates-in-advanced-technologies</id>
		<author>
			<name>Super User</name>
			<email>stefano.dicarlo@polito.it</email>
		</author>
		<summary type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;Marc Riera, Ramon Canal, Jaume Abella and Antonio Gonzalez, Design, Automation and Testing in Europe, 2016&lt;/p&gt;
&lt;p&gt;&lt;!--&lt;a href=&quot;http://www.clereco.eu/images/publications/IISWC.2015.28.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/IISWC.2015.28&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;--&gt;&amp;nbsp;&lt;a href=&quot;http://www.clereco.eu/images/presentations/2016-03-15-DATE16_UPC_Presentation.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;Presentation&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</summary>
		<content type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;Marc Riera, Ramon Canal, Jaume Abella and Antonio Gonzalez, Design, Automation and Testing in Europe, 2016&lt;/p&gt;
&lt;p&gt;&lt;!--&lt;a href=&quot;http://www.clereco.eu/images/publications/IISWC.2015.28.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/IISWC.2015.28&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;--&gt;&amp;nbsp;&lt;a href=&quot;http://www.clereco.eu/images/presentations/2016-03-15-DATE16_UPC_Presentation.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;Presentation&lt;/a&gt;&lt;/p&gt;
&lt;/div&gt;</content>
		<category term="Publications" />
	</entry>
	<entry>
		<title>GUFI: a Framework for GPUs Reliability Assessment</title>
		<link rel="alternate" type="text/html" href="http://www.clereco.eu/publications/item/149-gufi-a-framework-for-gpus-reliability-assessment"/>
		<published>2016-03-24T19:21:59+00:00</published>
		<updated>2016-03-24T19:21:59+00:00</updated>
		<id>http://www.clereco.eu/publications/item/149-gufi-a-framework-for-gpus-reliability-assessment</id>
		<author>
			<name>Super User</name>
			<email>stefano.dicarlo@polito.it</email>
		</author>
		<summary type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;S.Tselonis, D.Gizopoulos, IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS 2016), Uppsala, Sweden, April, 2016.&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/ISPASS.2016.7482077.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/ISPASS.2016.7482077&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;&lt;/div&gt;</summary>
		<content type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;S.Tselonis, D.Gizopoulos, IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS 2016), Uppsala, Sweden, April, 2016.&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/ISPASS.2016.7482077.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/ISPASS.2016.7482077&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;&lt;/div&gt;</content>
		<category term="Publications" />
	</entry>
	<entry>
		<title>Anatomy of Microarchitecture-Level Reliability Assessment: Throughput and Accuracy</title>
		<link rel="alternate" type="text/html" href="http://www.clereco.eu/publications/item/148-anatomy-of-microarchitecture-level-reliability-assessment-throughput-and-accuracy"/>
		<published>2016-03-24T19:21:00+00:00</published>
		<updated>2016-03-24T19:21:00+00:00</updated>
		<id>http://www.clereco.eu/publications/item/148-anatomy-of-microarchitecture-level-reliability-assessment-throughput-and-accuracy</id>
		<author>
			<name>Super User</name>
			<email>stefano.dicarlo@polito.it</email>
		</author>
		<summary type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;A.Chatzidimitriou, D.Gizopoulos, IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS 2016), Uppsala, Sweden, April, 2016.&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/ISPASS.2016.7482075.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/ISPASS.2016.7482075&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;&lt;/div&gt;</summary>
		<content type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;A.Chatzidimitriou, D.Gizopoulos, IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS 2016), Uppsala, Sweden, April, 2016.&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/ISPASS.2016.7482075.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/ISPASS.2016.7482075&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;&lt;/div&gt;</content>
		<category term="Publications" />
	</entry>
	<entry>
		<title>System-level Reliability Evaluation through Cache-aware Software-based Fault Injection</title>
		<link rel="alternate" type="text/html" href="http://www.clereco.eu/publications/item/147-system-level-reliability-evaluation-through-cache-aware-software-based-fault-injection"/>
		<published>2016-03-24T19:19:22+00:00</published>
		<updated>2016-03-24T19:19:22+00:00</updated>
		<id>http://www.clereco.eu/publications/item/147-system-level-reliability-evaluation-through-cache-aware-software-based-fault-injection</id>
		<author>
			<name>Super User</name>
			<email>stefano.dicarlo@polito.it</email>
		</author>
		<summary type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio, IEEE DDECS 2016, April 20-22, 2016, Košice, Slovakia&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/DDECS.2016.7482446.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/DDECS.2016.7482446&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;&lt;/div&gt;</summary>
		<content type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio, IEEE DDECS 2016, April 20-22, 2016, Košice, Slovakia&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/DDECS.2016.7482446.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/DDECS.2016.7482446&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;&lt;/div&gt;</content>
		<category term="Publications" />
	</entry>
	<entry>
		<title>Faults in Data Prefetchers: Performance Degradation and Variability</title>
		<link rel="alternate" type="text/html" href="http://www.clereco.eu/publications/item/146-faults-in-data-prefetchers-performance-degradation-and-variability"/>
		<published>2016-03-24T19:17:57+00:00</published>
		<updated>2016-03-24T19:17:57+00:00</updated>
		<id>http://www.clereco.eu/publications/item/146-faults-in-data-prefetchers-performance-degradation-and-variability</id>
		<author>
			<name>Super User</name>
			<email>stefano.dicarlo@polito.it</email>
		</author>
		<summary type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;N.Foutris, A.Chatzidimitriou, D.Gizopoulos, J.Kalamatianos, V.Sridharan, IEEE VLSI Test Symposium (VTS 2016), Las Vegas, NV, USA, April, 2016.&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/VTS.2016.7477312.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/VTS.2016.7477312&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;&lt;/div&gt;</summary>
		<content type="html">&lt;div class=&quot;K2FeedIntroText&quot;&gt;&lt;p&gt;N.Foutris, A.Chatzidimitriou, D.Gizopoulos, J.Kalamatianos, V.Sridharan, IEEE VLSI Test Symposium (VTS 2016), Las Vegas, NV, USA, April, 2016.&lt;/p&gt;
&lt;p&gt;&lt;a href=&quot;http://www.clereco.eu/images/publications/VTS.2016.7477312.pdf&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;PDF&lt;/a&gt;&amp;nbsp;&lt;a href=&quot;http://dx.doi.org/10.1109/VTS.2016.7477312&quot; target=&quot;_blank&quot; class=&quot;btn btn-info btn-mini&quot;&gt;DOI&lt;/a&gt;&lt;/p&gt;&lt;/div&gt;</content>
		<category term="Publications" />
	</entry>
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