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Tuesday, 09 September 2014 12:07

Paper accepted @ DFTS 2014

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Partner POLITO paper on Reliability Estimation at Block-Level Granularity of Spin-Transfer-Torque MRAMs has been accepted for publication at the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) 2014 held in Amsterdam ( 


The paper presents a methodology for predicting the reliability of an STT-MRAM based memory (assuming high thermal stability). The reliability estimation is performed at block level for different block sizes and access rates. The proposed methodology also allows for an exploration of required error correction capabilities as function of code word size to achieve desired reliability target for the memory under study.

If you plan to attend the conference, don't miss the presentation.

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