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International Workshop on Early Reliability Modeling for Aging and Variability in Silicon (ERMAVSS 2016) @ DATE16

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Friday, March 18th 2016, Dresden (Germany).
The event is part of the Friday workshops program of DATE 2016

https://ermavss.iroctech.com/

About

With the proliferation of integrated circuits implemented in the most advanced process technologies, there is a growing need to jointly analyze the effect of multiple sources of failures including variability and aging and to understand, early in the design cycle, their impact on system reliability.

Today, conservative margins are required to ensure devices operate correctly over their full lifetime, despite the impact of aging effects (BTI, HCI) and failure mechanisms such as EM. New methodologies for improved cross-layer modeling and mitigation, if planned early in the design of a product, have the potential to remove unnecessary conservatism, reduce power and cost and improve yield.

This workshop is focused on sharing new research on techniques and methodologies for modeling the effects of failures due to transistor aging, variability and other mechanisms all the way from the cell level to system level. New approaches to perform early estimations of system reliability are much needed to enable cost-effective designs jointly optimized with respect to reliability, power consumption as well as costs.

Submissions

The workshop is co-located with the ACM/IEEE DATE 2016 conference (https://www.date-conference.com/) in Dresden, Germany and will include talks from industry experts.

We are soliciting short papers to be presented during a poster-session. Authors are invited to submit a 2-4 page short papers (using the standard IEEE two-column conference format) on topics related to:

  • Early reliability modeling for complex silicon devices
  • Advanced Modeling of degradation effects (HCI, xBTI, EM) and variability
  • EDA flows and design tools for analyzing the effects of variability and aging
  • Assessment of semiconductor degradation and failure effects on embedded and safety critical systems
  • Modeling of the effects of environment, mission profile and workload on reliability

To submit your paper through EasyChair visit the workshop website at: https://ermavss.iroctech.com/.

Publications

Authors of accepted papers will be givend the possibility to publish their work under an ISSN in an open-access format through CEUR Workshop Proceedings. Copyright for the published material will be fully retained by the authors.

Important Dates

Submission Deadline: December 4th 2015
Author Notification: December 14th 2015
Final Paper Submission: January 29th 2016

Additional information

For more information about the workshop, please contact :
Adrian Evans (This email address is being protected from spambots. You need JavaScript enabled to view it.), or
Stefano Di Carlo (This email address is being protected from spambots. You need JavaScript enabled to view it.).

Organizers

General co-chairs

  • Adrian Evans (IROC Technologies, FR) 
  • Stefano di Carlo (Politecnico di Torino, IT)
  • Praveen Raghavan (IMEC, BE)
  • Dimitris Gizopoulos (University of Athens , GR)

Publicity Chair

  • Roland Jancke (Fraunhofer , DE)

Program Committee

  • Dan Alexandrescu (IROC Technologies, FR)
  • Ramon Canal (UPC , ES)
  • Arnaud Grasset (Thales, FR)
  • Olivier Heron (CEA , FR)
  • Riccardo Mariani (Yogitech , IT)
  • Tiberiu Seceleanu (ABB , SE)
  • Ulf Schlictmann (IROC Technologies, FR)
  • Lorena Anghel (TIMA Laboratory , FR)
  • Dan Alexandrescu (IROC Technologies, FR)
  • Edith Beigne (CEA , FR)

Sponsorship

This workshop is sponsored by the 7th Framework Program of the European Union through the CLERECO Project (https://www.clereco.eu), under Grant Agreement 611404 and through the MoRV Project (https://morv-project.eu), under Grant Agreement 619234.

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