NOTE! This site uses cookies and similar technologies.

If you not change browser settings, you agree to it. Learn more

I understand
Wednesday, 15 April 2015 00:00

Paper presentation @ DTIS 2015

Rate this item
(0 votes)

Partner POLITO presents a paper at DTIS 2015 on STT-MRAM Cell Reliability Evaluation under Process, Voltage and Temperature (PVT) Variations

This paper presents a reliability prediction model for MRAM taking into account process, voltage and temperature variations.

Download the presentation

2015-06-15-DTISpresentation_001

Read 2092 times
Published in News
More in this category: « Paper presentation @ IDT 2014 Paper presentation @ IISWC 2015 »

Add comment

Security code
Refresh

back to top