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Tuesday, 09 September 2014 09:55

Cross-layer early reliability evaluation: Challenges and promises

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Di Carlo, S.; Vallero, A; Gizopoulos, D.; Di Natale, G.; Gonzalez, A; Canal, R.; Mariani, R.; Pipponzi, M.; Grasset, A; Bonnot, P.; Reichenbach, F.; Rafiq, G.; Loekstad, T.,, in IEEE 20th International On-Line Testing Symposium (IOLTS), 2014, pp.228-233, 7-9 July 2014

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Abstract

Evaluation of computing systems reliability must be accurate enough to provide hints for the required fault protection mechanisms that will guarantee correctness of operation at acceptance costs. To be useful, reliability evaluation must be performed early enough in the design cycle when, however, the available details of the system are largely unknown. This inherent contradiction in terms: early vs. accurate, requires a cross-layer approach for reliability evaluation. Different layers of abstraction contribute differently in the overall system reliability; if this contribution can be assessed independently, the reliability of the system can be evaluated at the early stages of the design. We review the state-of-the-art in the area and discuss corresponding challenges.

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  •  BIBTEX:
@INPROCEEDINGS{
         6873704, 
         author={Di Carlo, S. and Vallero, A and Gizopoulos, D. and Di Natale, G. and Gonzalez, A and Canal, R. and Mariani, R. and Pipponzi, M. and Grasset, A and Bonnot, P. and Reichenbach, F. and Rafiq, G. and Loekstad, T.}, 
         booktitle={On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International}, 
         title={Cross-layer early reliability evaluation: Challenges and promises}, 
         year={2014}, 
         month={July}, 
         pages={228-233}, 
         doi={10.1109/IOLTS.2014.6873704},
}
  • DOI: 10.1109/IOLTS.2014.6873704
  • KEYWORDS: electronic engineering computing; reliability; computing systems; cross-layer early reliability evaluation; design cycle; fault protection mechanisms; Testing; computing systems; reliability evalution

 

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