<?xml version="1.0" encoding="utf-8"?>
<!-- generator="Joomla! - Open Source Content Management" -->
<rss version="2.0" xmlns:atom="http://www.w3.org/2005/Atom">
	<channel>
		<title>Publications</title>
		<description><![CDATA[Cross-Layer Early Reliability Evaluation for the Computing cOntinuum]]></description>
		<link>http://www.clereco.eu</link>
		<lastBuildDate>Tue, 30 Apr 2019 07:21:04 +0000</lastBuildDate>
		<generator>Joomla! - Open Source Content Management</generator>
		<atom:link rel="self" type="application/rss+xml" href="http://www.clereco.eu/publications?format=feed&amp;type=rss"/>
		<language>en-gb</language>
		<item>
			<title>Microarchitecture level reliability comparison of modern GPU designs: First findings</title>
			<link>http://www.clereco.eu/publications/item/175-microarchitecture-level-reliability-comparison-of-modern-gpu-designs-first-findings</link>
			<guid isPermaLink="true">http://www.clereco.eu/publications/item/175-microarchitecture-level-reliability-comparison-of-modern-gpu-designs-first-findings</guid>
			<description><![CDATA[<div class="K2FeedIntroText"><p>A. Vallero, S. Di Carlo, S. Tselonis and D. Gizopoulos,  2017 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS), Santa Rosa, CA, USA, 2017, pp. 129-130.
doi: 10.1109/ISPASS.2017.7975280</p>
<!--<p><a href="http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf" target="_blank" class="btn btn-info btn-mini">PDF</a>&nbsp;--><a href="https://doi.org/10.1109/ISPASS.2017.7975280" target="_blank" class="btn btn-info btn-mini">DOI</a></p>
</div>]]></description>
			<author>stefano.dicarlo@polito.it (Super User)</author>
			<category>Publications</category>
			<pubDate>Tue, 18 Jul 2017 06:45:47 +0000</pubDate>
		</item>
		<item>
			<title>MeRLiN: Exploiting Dynamic Instruction Behavior for Fast and Accurate Microarchitecture Level Reliability Assessment</title>
			<link>http://www.clereco.eu/publications/item/174-copy-of-performance-aware-reliability-assessment-of-heterogeneous-chips</link>
			<guid isPermaLink="true">http://www.clereco.eu/publications/item/174-copy-of-performance-aware-reliability-assessment-of-heterogeneous-chips</guid>
			<description><![CDATA[<div class="K2FeedIntroText"><p>Manolis Kaliorakis, Dimitris Gizopoulos, Ramon Canal, and Antonio Gonzalez. 2017. In Proceedings of the 44th Annual International Symposium on Computer Architecture (ISCA '17). ACM, New York, NY, USA, 241-254. DOI: https://doi.org/10.1145/3079856.3080225</p>
<!--<p><a href="http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf" target="_blank" class="btn btn-info btn-mini">PDF</a>&nbsp;--><a href="https://doi.org/10.1145/3079856.3080225" target="_blank" class="btn btn-info btn-mini">DOI</a></p>
</div>]]></description>
			<author>stefano.dicarlo@polito.it (Super User)</author>
			<category>Publications</category>
			<pubDate>Tue, 18 Jul 2017 06:40:57 +0000</pubDate>
		</item>
		<item>
			<title>Performance-aware reliability assessment of heterogeneous chips</title>
			<link>http://www.clereco.eu/publications/item/173-performance-aware-reliability-assessment-of-heterogeneous-chips</link>
			<guid isPermaLink="true">http://www.clereco.eu/publications/item/173-performance-aware-reliability-assessment-of-heterogeneous-chips</guid>
			<description><![CDATA[<div class="K2FeedIntroText"><p>A. Chatzidimitriou, M. Kaliorakis, S. Tselonis and D. Gizopoulos,  2017 IEEE 35th VLSI Test Symposium (VTS), Las Vegas, NV, 2017, pp. 1-6.
doi: 10.1109/VTS.2017.7928940</p>
<!--<p><a href="http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf" target="_blank" class="btn btn-info btn-mini">PDF</a>&nbsp;--><a href="http://dx.doi.org/10.1109/VTS.2017.7928940" target="_blank" class="btn btn-info btn-mini">DOI</a></p>
</div>]]></description>
			<author>stefano.dicarlo@polito.it (Super User)</author>
			<category>Publications</category>
			<pubDate>Tue, 18 Jul 2017 06:35:00 +0000</pubDate>
		</item>
		<item>
			<title>Cross-layer system reliability assessment framework for hardware faults</title>
			<link>http://www.clereco.eu/publications/item/172-cross-layer-system-reliability-assessment-framework-for-hardware-faults</link>
			<guid isPermaLink="true">http://www.clereco.eu/publications/item/172-cross-layer-system-reliability-assessment-framework-for-hardware-faults</guid>
			<description><![CDATA[<div class="K2FeedIntroText"><p>A. Vallero, A. Savino, G. Politano, S. Di Carlo, A. Chatzidimitriou, S. Tselonis, M. Kaliorakis, D. Gizopoulos, M. Riera, R. Canal, A. Gonzalez, M. Kooli, A. Bosio, G. Di Natale, 2016 IEEE International Test Conference (ITC), Fort Worth, TX, 2016, pp. 1-10., doi: 10.1109/TEST.2016.7805863</p>
<p><a href="http://www.clereco.eu/images/publications/TEST.2016.7805863.pdf" target="_blank" class="btn btn-info btn-mini">PDF</a>&nbsp;<a href="http://dx.doi.org/10.1109/TEST.2016.7805863" target="_blank" class="btn btn-info btn-mini">DOI</a></p>
</div>]]></description>
			<author>stefano.dicarlo@polito.it (Super User)</author>
			<category>Publications</category>
			<pubDate>Wed, 03 May 2017 13:55:24 +0000</pubDate>
		</item>
		<item>
			<title>RIIF-2: Toward the next generation reliability information interchange format</title>
			<link>http://www.clereco.eu/publications/item/171-riif-2-toward-the-next-generation-reliability-information-interchange-format</link>
			<guid isPermaLink="true">http://www.clereco.eu/publications/item/171-riif-2-toward-the-next-generation-reliability-information-interchange-format</guid>
			<description><![CDATA[<div class="K2FeedIntroText"><p>A. Savino, S. Di Carlo, A. Vallero, G. Politano, D. Gizopoulos,  A. Evans, IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS 2016), 4-6 July 2016</p>
<p><a href="http://www.clereco.eu/images/publications/IOLTS.2016.7604693.pdf" target="_blank" class="btn btn-info btn-mini">PDF</a>&nbsp;<a href="http://dx.doi.org/10.1109/IOLTS.2016.7604693" target="_blank" class="btn btn-info btn-mini">DOI</a></p>
</div>]]></description>
			<author>stefano.dicarlo@polito.it (Super User)</author>
			<category>Publications</category>
			<pubDate>Wed, 03 May 2017 13:47:51 +0000</pubDate>
		</item>
		<item>
			<title>A Detailed Methodology to Compute Soft-Error Rates in Advanced Technologies</title>
			<link>http://www.clereco.eu/publications/item/150-a-detailed-methodology-to-compute-soft-error-rates-in-advanced-technologies</link>
			<guid isPermaLink="true">http://www.clereco.eu/publications/item/150-a-detailed-methodology-to-compute-soft-error-rates-in-advanced-technologies</guid>
			<description><![CDATA[<div class="K2FeedIntroText"><p>Marc Riera, Ramon Canal, Jaume Abella and Antonio Gonzalez, Design, Automation and Testing in Europe, 2016</p>
<p><!--<a href="http://www.clereco.eu/images/publications/IISWC.2015.28.pdf" target="_blank" class="btn btn-info btn-mini">PDF</a>&nbsp;<a href="http://dx.doi.org/10.1109/IISWC.2015.28" target="_blank" class="btn btn-info btn-mini">DOI</a>-->&nbsp;<a href="http://www.clereco.eu/images/presentations/2016-03-15-DATE16_UPC_Presentation.pdf" target="_blank" class="btn btn-info btn-mini">Presentation</a></p>
</div>]]></description>
			<author>stefano.dicarlo@polito.it (Super User)</author>
			<category>Publications</category>
			<pubDate>Thu, 24 Mar 2016 19:24:13 +0000</pubDate>
		</item>
		<item>
			<title>GUFI: a Framework for GPUs Reliability Assessment</title>
			<link>http://www.clereco.eu/publications/item/149-gufi-a-framework-for-gpus-reliability-assessment</link>
			<guid isPermaLink="true">http://www.clereco.eu/publications/item/149-gufi-a-framework-for-gpus-reliability-assessment</guid>
			<description><![CDATA[<div class="K2FeedIntroText"><p>S.Tselonis, D.Gizopoulos, IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS 2016), Uppsala, Sweden, April, 2016.</p>
<p><a href="http://www.clereco.eu/images/publications/ISPASS.2016.7482077.pdf" target="_blank" class="btn btn-info btn-mini">PDF</a>&nbsp;<a href="http://dx.doi.org/10.1109/ISPASS.2016.7482077" target="_blank" class="btn btn-info btn-mini">DOI</a></p></div>]]></description>
			<author>stefano.dicarlo@polito.it (Super User)</author>
			<category>Publications</category>
			<pubDate>Thu, 24 Mar 2016 19:21:59 +0000</pubDate>
		</item>
		<item>
			<title>Anatomy of Microarchitecture-Level Reliability Assessment: Throughput and Accuracy</title>
			<link>http://www.clereco.eu/publications/item/148-anatomy-of-microarchitecture-level-reliability-assessment-throughput-and-accuracy</link>
			<guid isPermaLink="true">http://www.clereco.eu/publications/item/148-anatomy-of-microarchitecture-level-reliability-assessment-throughput-and-accuracy</guid>
			<description><![CDATA[<div class="K2FeedIntroText"><p>A.Chatzidimitriou, D.Gizopoulos, IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS 2016), Uppsala, Sweden, April, 2016.</p>
<p><a href="http://www.clereco.eu/images/publications/ISPASS.2016.7482075.pdf" target="_blank" class="btn btn-info btn-mini">PDF</a>&nbsp;<a href="http://dx.doi.org/10.1109/ISPASS.2016.7482075" target="_blank" class="btn btn-info btn-mini">DOI</a></p></div>]]></description>
			<author>stefano.dicarlo@polito.it (Super User)</author>
			<category>Publications</category>
			<pubDate>Thu, 24 Mar 2016 19:21:00 +0000</pubDate>
		</item>
		<item>
			<title>System-level Reliability Evaluation through Cache-aware Software-based Fault Injection</title>
			<link>http://www.clereco.eu/publications/item/147-system-level-reliability-evaluation-through-cache-aware-software-based-fault-injection</link>
			<guid isPermaLink="true">http://www.clereco.eu/publications/item/147-system-level-reliability-evaluation-through-cache-aware-software-based-fault-injection</guid>
			<description><![CDATA[<div class="K2FeedIntroText"><p>Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio, IEEE DDECS 2016, April 20-22, 2016, Košice, Slovakia</p>
<p><a href="http://www.clereco.eu/images/publications/DDECS.2016.7482446.pdf" target="_blank" class="btn btn-info btn-mini">PDF</a>&nbsp;<a href="http://dx.doi.org/10.1109/DDECS.2016.7482446" target="_blank" class="btn btn-info btn-mini">DOI</a></p></div>]]></description>
			<author>stefano.dicarlo@polito.it (Super User)</author>
			<category>Publications</category>
			<pubDate>Thu, 24 Mar 2016 19:19:22 +0000</pubDate>
		</item>
		<item>
			<title>Faults in Data Prefetchers: Performance Degradation and Variability</title>
			<link>http://www.clereco.eu/publications/item/146-faults-in-data-prefetchers-performance-degradation-and-variability</link>
			<guid isPermaLink="true">http://www.clereco.eu/publications/item/146-faults-in-data-prefetchers-performance-degradation-and-variability</guid>
			<description><![CDATA[<div class="K2FeedIntroText"><p>N.Foutris, A.Chatzidimitriou, D.Gizopoulos, J.Kalamatianos, V.Sridharan, IEEE VLSI Test Symposium (VTS 2016), Las Vegas, NV, USA, April, 2016.</p>
<p><a href="http://www.clereco.eu/images/publications/VTS.2016.7477312.pdf" target="_blank" class="btn btn-info btn-mini">PDF</a>&nbsp;<a href="http://dx.doi.org/10.1109/VTS.2016.7477312" target="_blank" class="btn btn-info btn-mini">DOI</a></p></div>]]></description>
			<author>stefano.dicarlo@polito.it (Super User)</author>
			<category>Publications</category>
			<pubDate>Thu, 24 Mar 2016 19:17:57 +0000</pubDate>
		</item>
	</channel>
</rss>
