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Thursday, 24 March 2016 19:24

A Detailed Methodology to Compute Soft-Error Rates in Advanced Technologies

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Marc Riera, Ramon Canal, Jaume Abella and Antonio Gonzalez, Design, Automation and Testing in Europe, 2016

 Presentation

Abstract

System reliability has become an important design aspect for computer systems due to the aggressive technology miniaturization. Errors are typically dominated by transient faults due to radiation and are strongly related to the technology used to build hardware. However, there is a lack of detailed methodologies to model and fairly compare soft error rates (SER) across different advanced technologies. Therefore, this work first describes a common methodology that from (1) technology models, (2) location (latitude, longitude and altitude), (3) operating conditions and (4) circuit descriptions (i.e. SRAM, latches, logic gates) can obtain accurate soft-error rates. Then, we use it to characterize soft errors through current and future technologies. Results at the technology layer show that new technologies, such as FinFET and SOI, can reduce SER up to 100x while the location can increase SER up to 650x.

 

Read 1317 times Last modified on Friday, 25 March 2016 15:12

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