Clereco
Cross-Layer Early Reliability Evaluation for the Computing cOntinuum
Cross-Layer Early Reliability Evaluation for the Computing cOntinuum
Partner UoA will present a paper at IEEE International Symposium on Workload Characterization (IISWC) 2015 on "Differential Fault Injection on Microarchitectural Simulators".
Advanced multifunctional computing systems realized in forthcoming technologies hold the promise of a significant increase of the computational capability that will offer end-users ever improving services and functionalities (e.g., next generation mobile devices, cloud services, etc.). However, the same path that is leading technologies toward these remarkable achievements is also making electronic devices increasingly unreliable posing a threat to our society that is depending on the computers and electronic devices in every aspect of human activities. As an example, the 2012 ITRS roadmap lists aging in semiconductor devices as one of the few most difficult challenges concerning reliability.
This workshop provides a unique chance to join experts from three on-going European projects that address several reliability challenges.The topics that will be covered include fault modeling in forthcoming technologies, careful early reliability evaluation of complex designs as well as techniques to address No Failure Found (NFF), which is caused by a combination of test escapes, aging, and environmental impact
Visit the workshop website for additional info
CLERECO in collaboration with EU projects BASTION and ELESIS organizes the 1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems on May 28-29, 2015 in Cluj-Napoca Romania.
Prof. S. Di Carlo (POLITO) and Prof. D. Gizopoulos (UoA) illustrate CLERECO's objectives during the HiPEAC Computing System Week in a special session organized withFP7 projects HARPA, CLERECO and EXCESS.
Some pictures collected during CLERECO presentations ETS 2015 in Cluj-Napoca, RO.
Some pictures collected at the CLERECO stand during DATE 2105 in Grenoble, France.
Partner POLITO presents a paper at IOLTS 2015 on Bayesian Network Early Reliability Evaluation Analysis for both permanent and transient faults.
Partner POLITO presents a paper at DTIS 2015 on STT-MRAM Cell Reliability Evaluation under Process, Voltage and Temperature (PVT) Variations
Maha Kooli from CNRS talks about "Hardware Independent Evaluation of Computer based System Reliability" at SETS 2015.
Partner POLITO presents a paper at HiPEAC 2015 on FLARES: an aging aware algorithm to autonomously adapt the error correction capability in NAND Flash memories
