Clereco

Cross-Layer Early Reliability Evaluation for the Computing cOntinuum

M. Kaliorakis, S. Tselonis, A. Chatzidimitriou and D. Gizopoulos,Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on, Amherst, MA, 2015, pp. 47-52.

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Di Carlo, S.; Vallero, A.; Gizopoulos, D.; Di Natale, G.; Grasset, A.; Mariani, R.; Reichenbach, F. in Euromicro Conference on Digital System Design (DSD), 2014, pp.199,205, 27-29 August 2014

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Di Carlo, S.; Vallero, A; Gizopoulos, D.; Di Natale, G.; Gonzalez, A; Canal, R.; Mariani, R.; Pipponzi, M.; Grasset, A; Bonnot, P.; Reichenbach, F.; Rafiq, G.; Loekstad, T.,, in IEEE 20th International On-Line Testing Symposium (IOLTS), 2014, pp.228-233, 7-9 July 2014

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Foutris, N.; Kaliorakis, M.; Tselonis, S.; Gizopoulos, D.,, in IEEE 20th International On-Line Testing Symposium (IOLTS), 2014, pp.140,145, 7-9 July 2014

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Foutris, N.; Gizopoulos, D.; Chatzidimitriou, A.;  Kalamatianos, J.; Sridharan, V., in Proceedings of the 10th IEEE Workshop on Silicon Errors in Logic – System Effects (SELSE 2014), Stanford, CA, USA, April 1-2, 2014. 

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